Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions
DOI:
https://doi.org/10.14311/ppt.2017.3.257Keywords:
electric arc, optical diagnostics, high speed video, arc root movementAbstract
The article deals with issues to be tackled when performing experiments with low voltage devices under real switching conditions and subsequently discusses various phenomena in an experimental device. The first part describes optimum setting of diagnostic equipment - mainly for optical diagnostic methods. The second part describes some phenomena encountered during switching process under real switching conditions - arc roots movement (cathode and anode spots). These phenomena are not only important for experimental study itself but also form necessary input data for numerical models and their validation.References
M. Lindmayer et al. Low-voltage switching arcs - experiments and modeling. In Proceedings of the XVth Symposium on Physics of Switching Arc, volume II, pages 252–267, 2003.
J. Quemeneur et al. Cathode arc root movement: Models comparison. Plasma Physics and Technology, 2(2):187–190, 2015.
M. Samohejl. Enhancement of optical diagnostics of the switching arc. Master’s thesis, Brno University of Technology, 2016.
J. Qu et al. Application of laser arc imaging technology to observe arc behavior and contact motion. Plasma Physics and Technology, 2(2):183–186, 2015.
M. Fendrych. Study of arc root movement in a model of the LV quenching system. Master’s thesis, Brno University of Technology, 2016.
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