ČERNÝ, R.; KALBÁČ, A. Modeling the Crystallization of Amorphous Silicon Thin Films Using a High Repetition Rate Scanning Laser. Acta Polytechnica, [S. l.], v. 40, n. 2, 2000. Disponível em: https://ojs.cvut.cz/ojs/index.php/ap/article/view/38. Acesso em: 20 apr. 2024.