Soft X-Ray Polarimeter: Potential Instrumentation and Observations

Authors

  • Herman L. Marshall MIT Kavli Institute, Cambridge, MA, USA
  • Norbert S. Schulz MIT Kavli Institute, Cambridge, MA, USA

DOI:

https://doi.org/10.14311/APP.2014.01.0288

Abstract

We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine three Stokes parameters: I, Q, and U - all as a function of energy. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors >90% over the entire 0.2 to 0.8 keV band. This instrument could be used in a small suborbital mission or adapted for use in an orbiting satellite to complement measurements at high energies. We present progress on laboratory work to demonstrate the capabilities of key components.

Downloads

Download data is not yet available.

Downloads

Published

2014-12-04

How to Cite

Soft X-Ray Polarimeter: Potential Instrumentation and Observations. (2014). Acta Polytechnica CTU Proceedings, 1(1), 288-292. https://doi.org/10.14311/APP.2014.01.0288