Parasitic Events in Envelope Analysis

Abstract

Envelope analysis allows fast fault location of individual gearboxes and parts of bearings by repetition frequency determination of the mechanical catch of an amplitude-modulated signal. Systematic faults arise when using envelope analysis on a signal with strong changes. The source of these events is the range of function definition of used in convolution integral definition. This integral is used for Hilbert image calculation of analyzed signal. Overshoots (almost similar to Gibbs events on a synthetic signal using the Fourier series) are result from these faults. Overshoots are caused by parasitic spectral lines in the frequency domain, which can produce faulty diagnostic analysis.This paper describes systematic arising during faults rising by signal numerical calculation using envelope analysis with Hilbert transform. It goes on to offer a mathematical analysis of these systematic faults.