Statistical Method for Testing of Sigma-Delta Converters

Authors

  • J. Vedral
  • J. Holub

DOI:

https://doi.org/10.14311/92

Abstract

Measurement and testing methodology for 2-channel insulated measuring module based S - D on Analog-to-Digital converter AD7710 that has a nominal resolution 16(24) bits is presented. The dependencies of effective resolution on the first notch frequency and gain are given.

Author Biographies

J. Vedral

J. Holub

Published

2000-01-03

Issue

Section

Articles