Statistical Method for Testing of Sigma-Delta Converters

Authors

  • J. Vedral
  • J. Holub

Abstract

Measurement and testing methodology for 2-channel insulated measuring module based S - D on Analog-to-Digital converter AD7710 that has a nominal resolution 16(24) bits is presented. The dependencies of effective resolution on the first notch frequency and gain are given.

Downloads

Download data is not yet available.

Author Biographies

J. Vedral

J. Holub

Published

2000-01-03

How to Cite

Vedral, J., & Holub, J. (2000). Statistical Method for Testing of Sigma-Delta Converters. Acta Polytechnica, 40(3). Retrieved from https://ojs.cvut.cz/ojs/index.php/ap/article/view/92

Issue

Vol. 40 No. 3 (2000)

Section

Articles

License

Copyright (c) 2015 Acta Polytechnica

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.