THE GOODNESS OF SIMULTANEOUS FITS IN ISIS
DOI:
https://doi.org/10.14311/APP.2016.56.0041Keywords:
Methods, data analysis, X-rays, binariesAbstract
In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.Downloads
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Published
2016-02-29
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Section
Articles
How to Cite
Kühnel, M., Falkner, S., Grossberger, C., Ballhausen, R., Dauser, T., Schwarm, F.-W., Kreykenbohm, I., Nowak, M. A., Pottschmidt, K., Ferrigno, C., Rothschild, R. E., Martínez-Núñez, S., Torrejón, J. M., Fürst, F., Klochkov, D., Staubert, R., Kretschmar, P., & Wilms, J. (2016). THE GOODNESS OF SIMULTANEOUS FITS IN ISIS. Acta Polytechnica, 56(1), 41-46. https://doi.org/10.14311/APP.2016.56.0041
Received 2015-08-12
Accepted 2015-12-03
Published 2016-02-29
Accepted 2015-12-03
Published 2016-02-29